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タイトルA Toolbox of Metrology-Based Techniques for Optical System Alignment
本文(外部サイト)http://hdl.handle.net/2060/20160010606
著者(英)Young, Jerrod; Mclean, Kyle F.; Redman, Kevin; Wenzel, Greg; Coulter, Phillip; Gum, Jeffrey S.; Hagopian, John G.; McMann, Joseph; Hicks, Samantha L.; Hadjimichael, Theodore J.; Ohl, Raymond G.; Bos, Brent J.; Casto, Gordon V.; Hayden, Joseph E.; Blake, Peter N.; Kubalak, Dave; Eichhorn, William L.
著者所属(英)NASA Goddard Space Flight Center
発行日2016-08-28
言語eng
内容記述The NASA Goddard Space Flight Center (GSFC) and its partners have broad experience in the alignment of flight optical instruments and spacecraft structures. Over decades, GSFC developed alignment capabilities and techniques for a variety of optical and aerospace applications. In this paper, we provide an overview of a subset of the capabilities and techniques used on several recent projects in a toolbox format. We discuss a range of applications, from small-scale optical alignment of sensors to mirror and bench examples that make use of various large-volume metrology techniques. We also discuss instruments and analytical tools.
NASA分類Instrumentation and Photography
レポートNOSPIE Paper 9951-7
GSFC-E-DAA-TN35096
権利Copyright, Distribution as joint owner in the copyright


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