タイトル | A Toolbox of Metrology-Based Techniques for Optical System Alignment |
本文(外部サイト) | http://hdl.handle.net/2060/20160010606 |
著者(英) | Young, Jerrod; Mclean, Kyle F.; Redman, Kevin; Wenzel, Greg; Coulter, Phillip; Gum, Jeffrey S.; Hagopian, John G.; McMann, Joseph; Hicks, Samantha L.; Hadjimichael, Theodore J.; Ohl, Raymond G.; Bos, Brent J.; Casto, Gordon V.; Hayden, Joseph E.; Blake, Peter N.; Kubalak, Dave; Eichhorn, William L. |
著者所属(英) | NASA Goddard Space Flight Center |
発行日 | 2016-08-28 |
言語 | eng |
内容記述 | The NASA Goddard Space Flight Center (GSFC) and its partners have broad experience in the alignment of flight optical instruments and spacecraft structures. Over decades, GSFC developed alignment capabilities and techniques for a variety of optical and aerospace applications. In this paper, we provide an overview of a subset of the capabilities and techniques used on several recent projects in a toolbox format. We discuss a range of applications, from small-scale optical alignment of sensors to mirror and bench examples that make use of various large-volume metrology techniques. We also discuss instruments and analytical tools. |
NASA分類 | Instrumentation and Photography |
レポートNO | SPIE Paper 9951-7 GSFC-E-DAA-TN35096 |
権利 | Copyright, Distribution as joint owner in the copyright |
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