| タイトル | Evaluation of Contamination Inspection and Analysis Methods through Modeling System Performance |
| 本文（外部サイト） | http://hdl.handle.net/2060/20160013836 |
| 著者（英） | Dever, Jason; Stuban, Steven M. F.; Seasly, Elaine |
| 発行日 | 2016-11-14 |
| 言語 | eng |
| 内容記述 | Contamination is usually identified as a risk on the risk register for sensitive space systems hardware. Despite detailed, time-consuming, and costly contamination control efforts during assembly, integration, and test of space systems, contaminants are still found during visual inspections of hardware. Improved methods are needed to gather information during systems integration to catch potential contamination issues earlier and manage contamination risks better. This research explores evaluation of contamination inspection and analysis methods to determine optical system sensitivity to minimum detectable molecular contamination levels based on IEST-STD-CC1246E non-volatile residue (NVR) cleanliness levels. Potential future degradation of the system is modeled given chosen modules representative of optical elements in an optical system, minimum detectable molecular contamination levels for a chosen inspection and analysis method, and determining the effect of contamination on the system. By modeling system performance based on when molecular contamination is detected during systems integration and at what cleanliness level, the decision maker can perform trades amongst different inspection and analysis methods and determine if a planned method is adequate to meet system requirements and manage contamination risk. |
| NASA分類 | Spacecraft Design, Testing and Performance |
| レポートNO | NF1676L-23929 |
| 権利 | Copyright, Distribution as joint owner in the copyright |
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