タイトル | Heatshield for Extreme Entry Environment Technology: Results from Acreage and Integrated Seams Arcjet Testing |
本文(外部サイト) | http://hdl.handle.net/2060/20170000286 |
著者(英) | Venkatapathy, Ethiraj |
著者所属(英) | NASA Ames Research Center |
発行日 | 2016-11-30 |
言語 | eng |
内容記述 | This invited talk will give a brief overview of the integrated heat-shield system design that requires seams and the extreme environment conditions that HEEET should be demonstrated to be capable of thermal performance without fail. We have tested HEEET across many different facilities and at conditions that are extreme. The presentation will highlight the performance of both the acreage as well as integrated seam at these conditions. The Invite talks are 10 min and hence this presentation will be short. |
NASA分類 | Spacecraft Design, Testing and Performance |
レポートNO | ARC-E-DAA-TN37359 |
権利 | No Copyright |