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タイトルHeatshield for Extreme Entry Environment Technology: Results from Acreage and Integrated Seams Arcjet Testing
本文(外部サイト)http://hdl.handle.net/2060/20170000286
著者(英)Venkatapathy, Ethiraj
著者所属(英)NASA Ames Research Center
発行日2016-11-30
言語eng
内容記述This invited talk will give a brief overview of the integrated heat-shield system design that requires seams and the extreme environment conditions that HEEET should be demonstrated to be capable of thermal performance without fail. We have tested HEEET across many different facilities and at conditions that are extreme. The presentation will highlight the performance of both the acreage as well as integrated seam at these conditions. The Invite talks are 10 min and hence this presentation will be short.
NASA分類Spacecraft Design, Testing and Performance
レポートNOARC-E-DAA-TN37359
権利No Copyright


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