| タイトル | Heavy-Ion Testing of the Freescale Qorivva 32-bit Automotive-Grade MCU |
| 本文（外部サイト） | http://hdl.handle.net/2060/20160009304 |
| 著者（英） | Wilcox, Ted; Seidleck, Christina; Casey, Megan; LaBel, Ken |
| 著者所属（英） | NASA Goddard Space Flight Center |
| 発行日 | 2016-07-13 |
| 言語 | eng |
| 内容記述 | We present single-event effects testing results from a commercially-available automotive microcontroller. We discuss the difficulties encountered testing with commercially-provided evaluation boards while attempting to classify the complex and varied failure modes of a modern 32-bit microcontroller. This work also describes some of the possible advantages to using off-the-shelf automotive-grade electronics for low-risk aerospace applications. |
| NASA分類 | Electronics and Electrical Engineering |
| レポートNO | GSFC-E-DAA-TN33286 |
| 権利 | Copyright, Distribution as joint owner in the copyright |
