| タイトル | Advanced CMOS Radiation Effects Testing Analysis |
| 本文（外部サイト） | http://hdl.handle.net/2060/20140017365 |
| 著者（英） | Seidleck, Christina M.; Pellish, Jonathan Allen; Castaneda, Carlos M.; Dodds, Nathaniel A.; Rodbell, Kenneth P.; Berg, Melanie D.; Gordon, Michael S.; Marshall, Paul W.; LaBel, Kenneth A.; Schwank, James R.; Phan, Anthony M.; Kim, Hak S. |
| 発行日 | 2014-06-17 |
| 言語 | eng |
| 内容記述 | Presentation at the annual NASA Electronic Parts and Packaging (NEPP) Program Electronic Technology Workshop (ETW). The material includes an update of progress in this NEPP task area over the past year, which includes testing, evaluation, and analysis of radiation effects data on the IBM 32 nm silicon-on-insulator (SOI) complementary metal oxide semiconductor (CMOS) process. The testing was conducted using test vehicles supplied by directly by IBM. |
| NASA分類 | Electronics and Electrical Engineering |
| レポートNO | GSFC-E-DAA-TN16640 |
| 権利 | Copyright, Distribution as joint owner in the copyright |
| URI | https://repository.exst.jaxa.jp/dspace/handle/a-is/61579 |
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