| タイトル | Method and Apparatus for Measuring Near-Angle Scattering of Mirror Coatings |
| 本文（外部サイト） | http://hdl.handle.net/2060/20140016610 |
| 著者（英） | McClain, Stephen C.; Daugherty, Brian J.; Macenka, Steven A.; Chipman, Russell A. |
| 著者所属（英） | NASA Headquarters |
| 発行日 | 2013-08-06 |
| 言語 | eng |
| 内容記述 | Disclosed herein is a method of determining the near angle scattering of a sample reflective surface comprising the steps of: a) splitting a beam of light having a coherence length of greater than or equal to about 2 meters into a sample beam and a reference beam; b) frequency shifting both the sample beam and the reference beam to produce a fixed beat frequency between the sample beam and the reference beam; c) directing the sample beam through a focusing lens and onto the sample reflective surface, d) reflecting the sample beam from the sample reflective surface through a detection restriction disposed on a movable stage; e) recombining the sample beam with the reference beam to form a recombined beam, followed by f) directing the recombined beam to a detector and performing heterodyne analysis on the recombined beam to measure the near-angle scattering of the sample reflective surface, wherein the position of the detection restriction relative to the sample beam is varied to occlude at least a portion of the sample beam to measure the near-angle scattering of the sample reflective surface. An apparatus according to the above method is also disclosed. |
| NASA分類 | Optics |
| 権利 | No Copyright |
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