| タイトル | CREPT-MCNP 1.1 (Calibration Code for the Representative Point Method with MCNP); User manual, Version 1.1.0 |
| その他のタイトル | CREPT-MCNP 1.1(代表点法を用いたゲルマニウム半導体検出器の効率校正用コード); ユーザーマニュアル版 1.1.0版 |
| DOI | 10.11484/jaea-data-code-2008-017 |
| 本文（外部サイト） | http://jolissrch-inter.tokai-sc.jaea.go.jp/pdfdata/JAEA-Data-Code-2008-017.pdf |
| 参考URL | http://jolissrch-inter.tokai-sc.jaea.go.jp/search/servlet/search?5013587 |
| 著者（日） | 三枝 純 |
| 発行日 | 2008-10 |
| 発行機関など | JAEA |
| 刊行物名 | JAEA-Data/Code 2008-017 |
| 開始ページ | 1 |
| 終了ページ | 72 |
| 刊行年月日 | 2008-10 |
| 言語 | en |
| 内容記述 | The representative point method is a novel method which enables efficiency calibrations with a standard point source. A calculation code for implementing the method has been developed. The code is named CREPT-MCNP ((C)alibration Code for the (Re)presentative (P)oin(t) Method with MCNP). The code estimates the position of the representative point which is intrinsic to each shape of volume sample, and also gives the self-absorption factors to make correction on the efficiencies measured at the representative point with a standard point source. It can deal with photons between 20 keV and 2 MeV with p- or n-type germanium semiconductor detectors. CREPT-MCNP can be operated under the Windows PC environment as a GUI based application. This manual describes features of CREPT-MCNP code.
著者所属: 日本原子力研究開発機構(JAEA) |
| 資料種別 | Technical Report |
| URI | https://repository.exst.jaxa.jp/dspace/handle/a-is/617091 |
