| タイトル | Inferring Zeff spatial profile from background light in incoherent Thomson scattering diagnostic |
| その他のタイトル | 非協同トムソン散乱計測における背景光データを用いた有効荷電数(Zeff)分布の測定 |
| DOI | 10.11484/jaeri-research-2002-033 |
| 本文（外部サイト） | http://jolissrch-inter.tokai-sc.jaea.go.jp/pdfdata/JAERI-Research-2002-033.pdf |
| 参考URL | http://jolissrch-inter.tokai-sc.jaea.go.jp/search/servlet/search?21541 |
| 著者（日） | 内藤 磨; 波多江 仰紀 |
| 発行日 | 2003-03 |
| 発行機関など | JAEA |
| 刊行物名 | JAERI-Research 2002-033 |
| 開始ページ | 1 |
| 終了ページ | 9 |
| 刊行年月日 | 2003-03 |
| 言語 | en |
| 内容記述 | A simulation study on the feasibility of inferring spatial Zeff profile along with electron temperature and density in Thomson scattering diagnostic is presented. The background signal, which is usually discarded after subtracted from the Thomson scattered signal, is used in the reconstruction procedure. If the contribution from line radiation to the background signal is by one order of magnitude smaller than that from bremsstrahlung, a fairly accurate Zeff profile can be reconstructed.
著者所属: 日本原子力研究開発機構(JAEA) |
| 資料種別 | Technical Report |
| URI | https://repository.exst.jaxa.jp/dspace/handle/a-is/617356 |
