| タイトル | Uncertainty Analysis of Seebeck Coefficient and Electrical Resistivity Characterization |
| 本文（外部サイト） | http://hdl.handle.net/2060/20140012564 |
| 著者（英） | Dynys, Fred; Sehirlioglu, Alp; Mackey, Jon |
| 著者所属（英） | NASA Glenn Research Center |
| 発行日 | 2014-01-22 |
| 言語 | eng |
| 内容記述 | In order to provide a complete description of a materials thermoelectric power factor, in addition to the measured nominal value, an uncertainty interval is required. The uncertainty may contain sources of measurement error including systematic bias error and precision error of a statistical nature. The work focuses specifically on the popular ZEM-3 (Ulvac Technologies) measurement system, but the methods apply to any measurement system. The analysis accounts for sources of systematic error including sample preparation tolerance, measurement probe placement, thermocouple cold-finger effect, and measurement parameters; in addition to including uncertainty of a statistical nature. Complete uncertainty analysis of a measurement system allows for more reliable comparison of measurement data between laboratories. |
| NASA分類 | Solid-State Physics; Electronics and Electrical Engineering |
| レポートNO | GRC-E-DAA-TN12884 |
| 権利 | Copyright, Distribution as joint owner in the copyright |
| URI | https://repository.exst.jaxa.jp/dspace/handle/a-is/62627 |
