タイトル | Compact Simultaneous-beam Optical Strain Measurement System, Phase 5 |
本文(外部サイト) | http://hdl.handle.net/2060/19950007253 |
著者(英) | Lant, Christian T. |
著者所属(英) | Sverdrup Technology, Inc. |
発行日 | 1994-10-01 |
言語 | eng |
内容記述 | Recent advances on the laser speckle strain measurement system under development at NASA Lewis Research Center have resulted in a compact, easy-to-use measurement package having many performance improvements over previous systems. NASA has developed this high performance optical strain measurement system for high temperature material testing applications. The system is based on I. Yamaguchi's two-beam speckle-shift strain measurement theory, and uses a new optical design that allows simultaneous recording of laser speckle patterns. This design greatly improves system response over previous implementations of the two-beam speckle-shift technique. The degree of immunity to transient rigid body motions is no longer dependent on the data transfer rate. The system automatically calculates surface strains at a frequency of about 5 Hz using a high speed digital signal processor in a personal computer. This system is fully automated, and can be operated remotely. This report describes the designs and methods used by the system, and shows low temperature strain test results obtained from small diameter tungsten-rhenium and palladium-chrome wires. |
NASA分類 | OPTICS |
レポートNO | 95N13666 NASA-CR-195396 E-9197 NAS 1.26:195396 |
権利 | No Copyright |
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