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タイトルCompact Simultaneous-beam Optical Strain Measurement System, Phase 5
本文(外部サイト)http://hdl.handle.net/2060/19950007253
著者(英)Lant, Christian T.
著者所属(英)Sverdrup Technology, Inc.
発行日1994-10-01
言語eng
内容記述Recent advances on the laser speckle strain measurement system under development at NASA Lewis Research Center have resulted in a compact, easy-to-use measurement package having many performance improvements over previous systems. NASA has developed this high performance optical strain measurement system for high temperature material testing applications. The system is based on I. Yamaguchi's two-beam speckle-shift strain measurement theory, and uses a new optical design that allows simultaneous recording of laser speckle patterns. This design greatly improves system response over previous implementations of the two-beam speckle-shift technique. The degree of immunity to transient rigid body motions is no longer dependent on the data transfer rate. The system automatically calculates surface strains at a frequency of about 5 Hz using a high speed digital signal processor in a personal computer. This system is fully automated, and can be operated remotely. This report describes the designs and methods used by the system, and shows low temperature strain test results obtained from small diameter tungsten-rhenium and palladium-chrome wires.
NASA分類OPTICS
レポートNO95N13666
NASA-CR-195396
E-9197
NAS 1.26:195396
権利No Copyright


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