AIREX: Single Event Analysis and Fault Injection Techniques Targeting Complex Designs Implemented in Xilinx-Virtex Family Field Programmable Gate Array (FPGA) Devices

タイトル	Single Event Analysis and Fault Injection Techniques Targeting Complex Designs Implemented in Xilinx-Virtex Family Field Programmable Gate Array (FPGA) Devices
本文（外部サイト）	http://hdl.handle.net/2060/20140008976
著者（英）	Berg, Melanie D.; Kim, Hak; LaBel, Kenneth
著者所属（英）	NASA Goddard Space Flight Center
発行日	2014-05-19
言語	eng
内容記述	An informative session regarding SRAM FPGA basics. Presenting a framework for fault injection techniques applied to Xilinx Field Programmable Gate Arrays (FPGAs). Introduce an overlooked time component that illustrates fault injection is impractical for most real designs as a stand-alone characterization tool. Demonstrate procedures that benefit from fault injection error analysis.
NASA分類	Space Radiation; Electronics and Electrical Engineering
レポートNO	GSFC-E-DAA-TN14592 GSFC-E-DAA-TN36685
権利	Copyright, Distribution as joint owner in the copyright