| タイトル | Genesis Solar Wind Collector Cleaning Assessment: 60366 Sample Case Study |
| 本文（外部サイト） | http://hdl.handle.net/2060/20140006567 |
| 著者（英） | Burkett, P. J.; Rodriguez, M. C.; Allton, J. H.; Goreva, Y. S.; Jurewicz, A. J.; Kuhlman, K. R.; Gonzalez, C. P.; Burnett, D. S.; Woolum, D. |
| 発行日 | 2014-03-17 |
| 言語 | eng |
| 内容記述 | In order to recognize, localize, characterize and remove particle and thin film surface contamination, a small subset of Genesis mission collector fragments are being subjected to extensive study via various techniques [1-5]. Here we present preliminary results for sample 60336, a Czochralski silicon (Si-CZ) based wafer from the bulk array (B/C). |
| NASA分類 | Chemistry and Materials (General) |
| レポートNO | JSC-CN-30369 |
| 権利 | Copyright, Distribution as joint owner in the copyright |
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