| タイトル | Development of Genesis Solar Wind Sample Cleanliness Assessment: Initial Report on Sample 60341 Optical Imagery and Elemental Mapping |
| 本文（外部サイト） | http://hdl.handle.net/2060/20140006551 |
| 著者（英） | Burnett, D. S.; Burkett, P. J.; Allton, J. H.; Gonzalez, C. P.; Rodriguez, P. J.; Jurewicz, A. J.; Woolum, D.; Goreva, Y. S. |
| 発行日 | 2014-03-17 |
| 言語 | eng |
| 内容記述 | Since 2005 the Genesis science team has experimented with techniques for removing the contaminant particles and films from the collection surface of the Genesis fragments. A subset of ~40 samples have been designated as "cleaning matrix" samples. These are small samples to which various cleaning approaches are applied and then cleanliness is assessed optically, by TRXRF, SEM, ToF-SIMS, XPS, ellipsometry or other means [1-9]. Most of these sam-ples remain available for allocation, with cleanliness assessment data. This assessment allows evaluation of various cleaning techniques and handling or analytical effects. Cleaning techniques investigated by the Genesis community include acid/base etching, acetate replica peels, ion beam, and CO2 snow jet cleaning [10-16]. JSC provides surface cleaning using UV ozone exposure and ultra-pure water (UPW) [17-20]. The UPW rinse is commonly used to clean samples for handling debris between processing by different researchers. Optical microscopic images of the sample taken before and after UPW cleaning show what has been added or removed during the cleaning process. |
| NASA分類 | Exobiology; Solar Physics; Lunar and Planetary Science and Exploration |
| レポートNO | JSC-CN-30295 |
| 権利 | Copyright, Distribution as joint owner in the copyright |
|
