| タイトル | Dielectric Constant Measurements for Characterizing Lunar Soils |
| 本文（外部サイト） | http://hdl.handle.net/2060/20050165132 |
| 著者（英） | Anderson, Robert C.; Schaap, M.; Buehler, M.; Kuhlman, G.; Seshadri, S. |
| 著者所属（英） | Jet Propulsion Lab., California Inst. of Tech. |
| 発行日 | 2005-01-01 |
| 言語 | eng |
| 内容記述 | The return to the Moon has ignited the need to characterize the lunar regolith using fast, reliable in-situ methods. Characterizing the physical properties of the rocks and soils can be very difficult because of the many complex parameters that influence the measurements. In particular, soil electrical property measurements are influenced by temperature, mineral type, grain size, porosity, and soil conductivity. Determining the dielectric constant of lunar materials may be very important in providing quick characterization of surface deposits, especially for the Moon. A close examination of the lunar regolith samples collected by the Apollo astronauts indicates that the rocks and soils on the Moon are dominated by silicates and oxides. In this presentation, we will show that determining the dielectric constant measurements can provide a simple, quick detection method for minerals that contain titanium, iron, and water. Their presence is manifest by an unusually large imaginary permittivity. |
| NASA分類 | Lunar and Planetary Science and Exploration |
| 権利 | Copyright, Distribution under U.S. Government purpose rights |
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