| タイトル | A Portable Surface Contamination Monitor Based on the Principle of Optically Stimulated Electron Emission (OSEE) |
| 本文（外部サイト） | http://hdl.handle.net/2060/20050042005 |
| 著者（英） | Perey, D. F. |
| 著者所属（英） | NASA Langley Research Center |
| 発行日 | 1996-01-01 |
| 言語 | eng |
| 内容記述 | Many industrial and aerospace processes involving the joining of materials, require sufficient surface cleanliness to insure proper bonding. Processes as diverse as painting, welding, or the soldering of electronic circuits will be compromised if prior inspection and removal of surface contaminants is inadequate. As process requirements become more stringent and the number of different materials and identified contaminants increases, various instruments and techniques have been developed for improved inspection. One such technique, based on the principle of Optically Stimulated Electron Emission (OSEE), has been explored for a number of years as a tool for surface contamination monitoring. Some of the benefits of OSEE are: it is non-contacting; requires little operator training; and has very high contamination sensitivity. This paper describes the development of a portable OSEE based surface contamination monitor. The instrument is suitable for both hand-held and robotic inspections with either manual or automated control of instrument operation. In addition, instrument output data is visually displayed to the operator and may be sent to an external computer for archiving or analysis. |
| NASA分類 | Instrumentation and Photography |
| 権利 | No Copyright |
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