| タイトル | Analysis of the Mutual Inductance between Two Parallel Plates for the Detection of Surface Flaws |
| 本文（外部サイト） | http://hdl.handle.net/2060/20040129653 |
| 著者（英） | Clendenin, C. G.; Wincheski, B.; Fulton, J. P.; Namking, M. |
| 著者所属（英） | NASA Langley Research Center |
| 発行日 | 1992-01-01 |
| 言語 | eng |
| 内容記述 | There has recently been much effort behind the development of NDE methods applicable to the detection of surface/subsurface flaws in thin metallic structures with a rapid scan capability. One such method, an electromagnetic technique using a current-sheet parallel to the surface of a specimen in order to induce eddy current flow shows a high potential for satisfying the rapid scan requirement stated above. The technique is based on the detection of flaw-induced magnetic field components normal to the specimen surface by an appropriate detection mechanism positioned above the current-sheet as shown schematically in Fig. 1. As indicated in this figure, the current-sheet separates the source of the normal magnetic field components from the detector in such a way that the electric and magnetic properties of the current-sheet can be a major factor affecting the strength of the detected signals. The purpose of the present study is, therefore, to perform a detailed investigation on the effect of the material properties of the current-sheet on the detected signal strength and to establish a simple theoretical model for the detection mechanism. |
| NASA分類 | Electronics and Electrical Engineering |
| 権利 | No Copyright |
| URI | https://repository.exst.jaxa.jp/dspace/handle/a-is/87825 |
