| タイトル | The Deflection Plate Analyzer: A Technique for Space Plasma Measurements Under Highly Disturbed Conditions |
| 本文（外部サイト） | http://hdl.handle.net/2060/20040111097 |
| 著者（英） | Smith, Dennis; Dutton, Ken; Martinez, Nelson; Wright, Kenneth H., Jr.; Stone, Nobie H. |
| 著者所属（英） | NASA Marshall Space Flight Center |
| 発行日 | 2004-03-01 |
| 言語 | eng |
| 内容記述 | A technique has been developed to measure the characteristics of space plasmas under highly disturbed conditions; e.g., non-Maxwellian plasmas with strong drifting populations and plasmas contaminated by spacecraft outgassing. The present method is an extension of the capabilities of the Differential Ion Flux Probe (DIFP) to include a mass measurement that does not include either high voltage or contamination sensitive devices such as channeltron electron multipliers or microchannel plates. This reduces the complexity and expense of instrument fabrication, testing, and integration of flight hardware as compared to classical mass analyzers. The new instrument design is called the Deflection Plate Analyzer (DPA) and can deconvolve multiple ion streams and analyze each stream for ion flux intensity (density), velocity (including direction of motion), mass, and temperature (or energy distribution). The basic functionality of the DPA is discussed. The performance characteristics of a flight instrument as built for an electrodynamic tether mission, the Propulsive Small Expendable Deployer System (ProSEDS), and the instrument s role in measuring key experimental conditions are also discussed. |
| NASA分類 | Spacecraft Instrumentation and Astrionics |
| 権利 | No Copyright |
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