| タイトル | Low Temperature SQUID for NDE Applications |
| 本文（外部サイト） | http://hdl.handle.net/2060/20040045173 |
| 著者（英） | Wincheski, Buzz; Selim, Raouf |
| 著者所属（英） | Christopher Newport Univ. |
| 発行日 | 2003-01-01 |
| 言語 | eng |
| 内容記述 | We have developed a low temperature SuperConducting Quantum Interference Device - SQUID measurement system for detection of defects deep under the surface of aluminum structures using eddy current techniques. The system uses a two dimensional planar inducer with two different excitation frequencies to induce a current in the sample. We have developed a data analysis software program that enabled us to distinguish between round defects (holes), straight defects (slots) and slots close to holes simulating cracks starting from rivets in aluminum structures. We were able to detect defects that are 8mm below the surface. We have also measured the change in phase of the detected signal as a function of depth of the defect. This relationship can be used to determine the depth of hidden flaws. Using this analysis software with the high temperature SQUID system at NASA Langley we were able to detect slots close to holes in layered aluminum sample. |
| NASA分類 | Instrumentation and Photography |
| 権利 | No Copyright |
| URI | https://repository.exst.jaxa.jp/dspace/handle/a-is/89348 |
