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タイトルFabrication and Metrology of High-Precision Foil Mirror Mounting Elements
本文(外部サイト)http://hdl.handle.net/2060/20020070290
著者(英)Schattenburg, Mark L.
著者所属(英)Massachusetts Inst. of Tech.
発行日2002-08-18
言語eng
内容記述During the period of this Cooperative Agreement, MIT (Massachusetts Institute of Technology) developed advanced methods for applying silicon microstructures for the precision assembly of foil x-ray optics in support of the Constellation-X Spectroscopy X-ray Telescope (SXT) development effort at Goddard Space Flight Center (GSFC). MIT developed improved methods for fabricating and characterizing the precision silicon micro-combs. MIT also developed and characterized assembly tools and several types of metrology tools in order to characterize and reduce the errors associated with precision assembly of foil optics. Results of this effort were published and presented to the scientific community and the GSFC SXT team. A bibliography of papers and presentations is offered.
NASA分類Optics
レポートNOMIT-OSP-6891677
権利No Copyright
URIhttps://repository.exst.jaxa.jp/dspace/handle/a-is/91306


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