| タイトル | Issues and Effects of Atomic Oxygen Interactions With Silicone Contamination on Spacecraft in Low Earth Orbit |
| 本文（外部サイト） | http://hdl.handle.net/2060/20000064110 |
| 著者（英） | Rutledge, Sharon; deGroh, Kim; Brinker, David; Haytas, Christy; Snyder, Aaron; Sechkar, Edward; Banks, Bruce; Stueber, Thomas |
| 著者所属（英） | NASA Glenn Research Center |
| 発行日 | 2000-05-01 |
| 言語 | eng |
| 内容記述 | The continued presence and use of silicones on spacecraft in low Earth orbit (LEO) has been found to cause the deposition of contaminant films on surfaces which are also exposed to atomic oxygen. The composition and optical properties of the resulting SiO(x)- based (where x is near 2) contaminant films may be dependent upon the relative rates of arrival of atomic oxygen, silicone contaminant and hydrocarbons. This paper presents results of in-space silicone contamination tests, ground laboratory simulation tests and analytical modeling to identify controlling processes that affect contaminant characteristics. |
| NASA分類 | Spacecraft Design, Testing and Performance |
| レポートNO | E-12258
NASA/TM-2000-210056
NAS 1.15:210056 |
| 権利 | No Copyright |
| URI | https://repository.exst.jaxa.jp/dspace/handle/a-is/94331 |
