| タイトル | Technology for Elevated Temperature Tests of Structural Panels |
| 本文（外部サイト） | http://hdl.handle.net/2060/19990078561 |
| 著者（英） | Thornton, E. A. |
| 著者所属（英） | Virginia Univ. |
| 発行日 | 1999-07-01 |
| 言語 | eng |
| 内容記述 | A technique for full-field measurement of surface temperature and in-plane strain using a single grid imaging technique was demonstrated on a sample subjected to thermally-induced strain. The technique is based on digital imaging of a sample marked by an alternating line array of La2O2S:Eu(+3) thermographic phosphor and chromium illuminated by a UV lamp. Digital images of this array in unstrained and strained states were processed using a modified spin filter. Normal strain distribution was determined by combining unstrained and strained grid images using a single grid digital moire technique. Temperature distribution was determined by ratioing images of phosphor intensity at two wavelengths. Combined strain and temperature measurements demonstrated on the thermally heated sample were DELTA-epsilon = +/- 250 microepsilon and DELTA-T = +/- 5 K respectively with a spatial resolution of 0.8 mm. |
| NASA分類 | Structural Mechanics |
| レポートNO | SEAS-UVA/528515/MAE00/101 |
| 権利 | No Copyright |
| URI | https://repository.exst.jaxa.jp/dspace/handle/a-is/95924 |
