| タイトル | Radiation Effects on Current Field Programmable Technologies |
| 本文（外部サイト） | http://hdl.handle.net/2060/19990017985 |
| 著者（英） | LaBel, K.; Koga, R.; Wang, J. J.; Cronquist, B.; Katz, R.; Swift, G.; Penzin, S. |
| 著者所属（英） | NASA Goddard Space Flight Center |
| 発行日 | 1997-12-01 |
| 言語 | eng |
| 内容記述 | Manufacturers of field programmable gate arrays (FPGAS) take different technological and architectural approaches that directly affect radiation performance. Similar y technological and architectural features are used in related technologies such as programmable substrates and quick-turn application specific integrated circuits (ASICs). After analyzing current technologies and architectures and their radiation-effects implications, this paper includes extensive test data quantifying various devices total dose and single event susceptibilities, including performance degradation effects and temporary or permanent re-configuration faults. Test results will concentrate on recent technologies being used in space flight electronic systems and those being developed for use in the near term. This paper will provide the first extensive study of various configuration memories used in programmable devices. Radiation performance limits and their impacts will be discussed for each design. In addition, the interplay between device scaling, process, bias voltage, design, and architecture will be explored. Lastly, areas of ongoing research will be discussed. |
| NASA分類 | Electronics and Electrical Engineering |
| 権利 | No Copyright |
| URI | https://repository.exst.jaxa.jp/dspace/handle/a-is/96947 |
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